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Reliability of new semiconductor devices for long-distance optical submarine-cable systems

✍ Scribed by Tatekura, K.; Niro, Y.

Book ID: 114555299
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 840 KB
Volume: 37
Category: Article
ISSN: 0018-9529
DOI: 10.1109/24.3706

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