Reliability of new semiconductor devices for long-distance optical submarine-cable systems : Koichi Tatekura and Yasuhiko Niiro. IEEE Trans. Reliab. 37, 3 (1988)

• Book ID: 103285726
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 129 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90242-4