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Reliability of MOCVD grown AlGaAs/GaAs laser diodes at -20 C heatsink temperature

✍ Scribed by Begley, D.L.; Dreisewerd, D.; Fritz, W.; Schwedt, S.; Elliott, G.; Langill, T.; Luft, J.; Wudy, E.


Book ID
119785808
Publisher
IEEE
Year
1990
Tongue
English
Weight
316 KB
Volume
2
Category
Article
ISSN
1041-1135

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