Reliability of majority voting based VLSI fault-tolerant circuits : Charles E. Stroud. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2, 4, 516 (December 1994)

• Book ID: 103286670
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 227 KB
• Volume: 36
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(96)81945-7