𝔖 Bobbio Scriptorium

✦ LIBER ✦

Diagnosing scan chain faults : Sandip Kundu. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2, 4, 512 (December 1994)

Book ID: 103286660
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 202 KB
Volume: 36
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(96)81935-4

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