Reliability of loss-coupled 1.55 μm DFB laser diode with automatically buried absorptive InAsP layer
✍ Scribed by Jae-Ho Han; Sung-Woong Park
- Book ID
- 102522374
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 156 KB
- Volume
- 49
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
Abstract
The authors achieved loss‐coupled 1.55 μm distributed feedback laser diode incorporating automatically buried absorptive layer implemented by a single step growth that simplifies device fabrication than those of conventional ones. Based on 2800 h of accelerated aging test, estimated lifetime is 1.4 × 10^6^ h at room temperature. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 636–638, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22208
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