Reliability of loss-coupled 1.55 μm DFB
Reliability of loss-coupled 1.55 μm DFB laser diode with automatically buried absorptive InAsP layer
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Jae-Ho Han; Sung-Woong Park
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Article
📅
2007
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John Wiley and Sons
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English
⚖ 156 KB
## Abstract The authors achieved loss‐coupled 1.55 μm distributed feedback laser diode incorporating automatically buried absorptive layer implemented by a single step growth that simplifies device fabrication than those of conventional ones. Based on 2800 h of accelerated aging test, estimated lif