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Reliability of High-Voltage LSI's Made Using the Dielectric Isolation Process

✍ Scribed by Mori, M.; Sano, K.

Book ID: 117911581
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 540 KB
Volume: 8
Category: Article
ISSN: 0148-6411
DOI: 10.1109/tchmt.1985.1136544

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