✦ LIBER ✦
Reliability of high-voltage LSI's made using the dielectric isolation process : Masamichi Mori and Koichi Sano. IEEE Trans. Compon. Hybrids mfg Technol.CHMT-8 (4), (1985)
- Book ID
- 103280617
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 135 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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