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Reliability of GaAs FET : Satoshi Mizugashira and Emiko Sakaguchi. Proc. 15th Symp. Reliab. Maintainab. (Union of Japanese Scientists and Engineers, Tokyo), 53 (1985)

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 135 KB
Volume: 27
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(87)90200-9

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