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Reliability of electromechanical switching devices—an engineer's views

✍ Scribed by N.E. Hyde

Publisher
Elsevier Science
Year
1967
Tongue
English
Weight
927 KB
Volume
6
Category
Article
ISSN
0026-2714

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Reliability of devices affected by early
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✍ G.C. Maccarini; L. Zavanella; A. Bugini 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 384 KB

In this paper the concept of device life has been examined from the point of view of users compelled to manage a profitable preventive maintenance of components affected by early failures. Failure device probability density function (pdf) and its cumulative curve leads also to the component reliabil