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Reliability Mechanisms of LTPS-TFT With Gate Dielectric: PBTI, NBTI, and Hot-Carrier Stress

✍ Scribed by Ming-Wen Ma; Chih-Yang Chen; Woei-Cherng Wu; Chun-Jung Su; Kuo-Hsing Kao; Tien-Sheng Chao; Tan-Fu Lei

Book ID: 114619388
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 1017 KB
Volume: 55
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2008.919710

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