Reliability improvement of a-Si:H thin film transistors on plastic substrate with saturation in deep state after multiple bending cycles

✍ Scribed by Lee, M.H.; Chen, P.-G.; Hsu, C.-C.

• Book ID: 122065451
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 574 KB
• Volume: 544
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2013.04.102