Electrical properties correlated with redistributed deep states in a-Si:H thin-film transistors on flexible substrates undergoing mechanical bending

✍ Scribed by Lee, M.H.; Hsieh, B.-F.; Chang, S.T.

• Book ID: 123162266
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 570 KB
• Volume: 528
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2012.10.097