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Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design

โœ Scribed by Chang, Yuan-Hao; Huang, Po-Chun; Hsu, Pei-Han; Lee, Lue-Jane; Kuo, Tei-Wei; Du, David Hung-Chang


Book ID
120058929
Publisher
IEEE
Year
2013
Tongue
English
Weight
991 KB
Volume
62
Category
Article
ISSN
0018-9340

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This work is motivated by the strong demand of reliability enhancement over flash memory. Our objective is to improve the endurance of flash memory with limited overhead and without many modifications to popular implementation designs, such as Flash Translation Layer protocol (FTL) and NAND Flash Tr