[ACM Press the 44th annual conference -
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Chang, Yuan-Hao; Hsieh, Jen-Wei; Kuo, Tei-Wei
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Article
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2007
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ACM Press
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This work is motivated by the strong demand of reliability enhancement over flash memory. Our objective is to improve the endurance of flash memory with limited overhead and without many modifications to popular implementation designs, such as Flash Translation Layer protocol (FTL) and NAND Flash Tr