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[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - Endurance enhancement of flash-memory storage systems

โœ Scribed by Chang, Yuan-Hao; Hsieh, Jen-Wei; Kuo, Tei-Wei


Book ID
125500471
Publisher
ACM Press
Year
2007
Weight
283 KB
Category
Article
ISBN
1595936270
ISSN
0738-100X

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[ACM Press the 44th annual conference -
โœ Chang, Yuan-Hao; Hsieh, Jen-Wei; Kuo, Tei-Wei ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› ACM Press โš– 283 KB

This work is motivated by the strong demand of reliability enhancement over flash memory. Our objective is to improve the endurance of flash memory with limited overhead and without many modifications to popular implementation designs, such as Flash Translation Layer protocol (FTL) and NAND Flash Tr