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Reliability assessment of the metallized film capacitors from degradation data

✍ Scribed by Jianyin Zhao; Fang Liu

Book ID: 104057920
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 293 KB
Volume: 47
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2006.05.013

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