Reliability Assessment of Metallized Film Capacitors using Reduced Degradation Test Sample

✍ Scribed by Quan Sun; Yanzhen Tang; Jing Feng; Tongdan Jin

• Book ID: 112184056
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 733 KB
• Volume: 29
• Category: Article
• ISSN: 0748-8017
• DOI: 10.1002/qre.1307