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Reliability assessment and degradation analysis of 1.3 μm GaInNAs lasers

✍ Scribed by W. Lu; S. Bull; J. J. Lim; R. Mackenzie; S. Sujecki; A. V. Andrianov; M. Sadeghi; S. M. Wang; A. Larsson; P. Melanen; P. Sipilä; P. Uusimaa; C. T. Foxon; E. C. Larkins

Book ID: 121844567
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 774 KB
Volume: 106
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3256156

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