Reliability and Radiation Effects in Compound Semiconductors

✍ Scribed by Johnston, Allan

Publisher: World Scientific
Year: 2010
Tongue: English
Leaves: 378
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. First, it starts with principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for 10 years or more with low failure rates.

✦ Table of Contents

Content:
Front Matter
• Preface
• Table of Contents
1. Introduction
2. Semiconductor Fundamentals
3. Transistor Technologies
4. Optoelectronics
5. Reliability Fundamentals
6. Compound Semiconductor Reliability
7. Optoelectronic Device Reliability
8. Radiation Environments
9. Interactions of Radiation with Semiconductors
10. Displacement Damage in Compound Semiconductors
11. Displacement Damage in Optoelectronic Devices
12. Radiation Damage in Optocouplers
13. Effects from Single Particles
Index

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