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Reliability analysis of an intermittently used system : S. K. Srinivasan. Microelectron. Reliab.23 (2), 295 (1983)

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 130 KB
Volume: 24
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(84)90275-0

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