Availability measures for an intermittently used repairable system : P. K. Kapur, T. V. Natarajan and Debashish Chakrabarty. Microelectron. Reliab.23 (5), 841 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 152 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90076-3