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Relevance of length scales in exchange biased submicron dots

✍ Scribed by Li, Zhi-Pan; Morales, R.; Schuller, Ivan K.

Book ID: 119964199
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 559 KB
Volume: 94
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3114372

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