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Measurement of spin diffusion length in sputtered Ni films using a special exchange-biased spin valve geometry

✍ Scribed by Moreau, Charles E.; Moraru, Ion C.; Birge, Norman O.; Pratt, William P.


Book ID
120064546
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
379 KB
Volume
90
Category
Article
ISSN
0003-6951

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