Relation of polycrystalline Cu(In,Ga)Se2 device efficiency with junction depth and interfacial structure

✍ Scribed by Art J. Nelson; A.M. Gabor; M.A. Contreras; A. Mason; P. Asoka-Kumar; K.G. Lynn

• Book ID: 108029296
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 448 KB
• Volume: 41-42
• Category: Article
• ISSN: 0927-0248
• DOI: 10.1016/0927-0248(95)00104-2