๐”– Bobbio Scriptorium
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Relation between delamination and temperature cycling induced failures in plastic packaged devices : Karel Van Doorselaer and Kees De Zeeuw. IEEE Trans. Compon. Hybrids mfg Technol.13(4), 879 (1990)


Book ID
103287580
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
129 KB
Volume
31
Category
Article
ISSN
0026-2714

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