Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design discusses new approaches to better timing-closure and manufacturability of DSM Integrated Circuits. The key idea presented is the use of regular circuit and interconnect structures such that area/delay can be predicted with high accuracy.
Regular fabrics in deep sub-micron integrated-circuit design
โ Scribed by Fan Mo; Robert King Brayton
- Publisher
- Kluwer Academic Publishers
- Year
- 2004
- Tongue
- English
- Leaves
- 255
- Category
- Library
No coin nor oath required. For personal study only.
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