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Refractive index profiling of CeO2 thin films using reverse engineering methods

โœ Scribed by V Janicki; H Zorc

Book ID
108388421
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
124 KB
Volume
413
Category
Article
ISSN
0040-6090

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Refractive index and thickness determina
Refractive index and thickness determination of thin-films using Lloydโ€™s interferometer
โœ A.A. Hamza; M.A. Mabrouk; W.A. Ramadan; A.M. Emara ๐Ÿ“‚ Article ๐Ÿ“… 2003 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 326 KB

Determination of the refractive index and the thickness of thin-films using light interference have been presented. This has been done, for the first time, with the use of Lloydร•s interferometer. The mean idea is based on using the sample in two different positions in the same interferometer. The me