✦ LIBER ✦

Reflectivity of Ag layers on Al substrate

✍ Scribed by R. Monreal; F. Flores; F. García-Moliner

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 252 KB
Volume: 41
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(82)90258-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Atomic layer epitaxy (ALE) on porous sub

Atomic layer epitaxy (ALE) on porous substrates

✍ Eeva-Liisa Lakomaa 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 935 KB

Study of Al2O3/TiO2 reflectivity enhanci

Study of Al2O3/TiO2 reflectivity enhancing bi-layer films on bright aluminium substrates

✍ L. Cecchetto; C. Millon; D. Riassetto; M. Langlet 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 238 KB

The reflectance spectroscopy of silver s

The reflectance spectroscopy of silver surface layers on gold and aluminium substrates

✍ M. De Crescenzi; T. Lopez-Rios; G. Vuye; N.J. Mansur; Y. Borensztein 📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 176 KB

Two-layer hybrid anti-reflection film pr

Two-layer hybrid anti-reflection film prepared on the plastic substrates

✍ Jin-Yeol Kim; Yang-Kyoo Han; Eung-Ryul Kim; Kwang-Suck Suh 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 178 KB

Infrared reflectance analysis of GaN epi

Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates

✍ Z.C. Feng; T.R. Yang; Y.T. Hou 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 282 KB

Infrared reflectance (IR) of GaN grown on sapphire and silicon substrates has been studied both theoretically and experimentally. The theoretical calculation of the IR spectra is based on the transfer matrix method. The IR spectral characteristics influenced by several factors, such as film thicknes

Reflection electron diffraction patterns

Reflection electron diffraction patterns from Si layers epitaxially grown on BP-Si substrates

✍ Katsufusa Shono; Chul-Ju Kim 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 285 KB