Reflectivity and scattering measurements of an Advanced X-ray Astrophysics Facility test coating sample

✍ Scribed by Bixler, J. V. ;Mauche, C. W. ;Hailey, C. J. ;Madison, L.

• Book ID: 115344548
• Publisher: The Optical Society
• Year: 1995
• Tongue: English
• Weight: 314 KB
• Volume: 34
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.34.006542