✦ LIBER ✦
Spatial intensity profile of an X-ray beam reflected from nearly perfect silicon and diffuse scattering measurements
✍ Scribed by Entin, I. R. ;Khrupa, V. I.
- Book ID
- 114500486
- Publisher
- International Union of Crystallography
- Year
- 1991
- Tongue
- English
- Weight
- 208 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0021-8898
No coin nor oath required. For personal study only.