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Reflection mode X-ray absorption spectroscopy: new applications in surface science research

✍ Scribed by Dirk Lützenkirchen-Hecht; Ronald Frahm

Book ID
108238686
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
222 KB
Volume
357
Category
Article
ISSN
0921-4526

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Near surface layers structure data as r, N, a, AEo and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 -~ -i/3 for each layer can be calculated. The application of the Fresnel t