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Reflection electron microscopy of clean and gold deposited (111) silicon surfaces

✍ Scribed by N. Osakabe; Y. Tanishiro; K. Yagi; G. Honjo


Publisher
Elsevier Science
Year
1980
Weight
112 KB
Volume
97
Category
Article
ISSN
0167-2584

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Two beam interferences produced using an electrostatic biprism, which is inserted in the position of the selected area diaphragm of a commercial electron microscope, may be used in reflection electron microscopy to determine the phase shifts induced by structures on single crystal surfaces. A descri