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Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet–soft-x-ray region

✍ Scribed by Soufli, Regina ;Gullikson, Eric M.

Book ID
115346250
Publisher
The Optical Society
Year
1997
Tongue
English
Weight
316 KB
Volume
36
Category
Article
ISSN
1559-128X

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