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Refinement of conditions of point-contact current imaging atomic force microscopy for molecular-scale conduction measurements

✍ Scribed by Yajima, Takashi; Tanaka, Hirofumi; Matsumoto, Takuya; Otsuka, Yoichi; Sugawara, Yoshitaka; Ogawa, Takuji

No coin nor oath required. For personal study only.

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