Reduction of RTS Noise in Small-Area MOSFETs Under Switched Bias Conditions and Forward Substrate Bias

✍ Scribed by Zanolla, N.; Siprak, D.; Tiebout, M.; Baumgartner, P.; Sangiorgi, E.; Fiegna, C.

• Book ID: 114619956
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 343 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2043554