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[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - Reduction of low-frequency noise in MOSFETs under switched gate and substrate bias

✍ Scribed by Siprak, Domagoj; Zanolla, Nicola; Tiebout, Marc; Baumgartner, Peter; Fiegna, Claudio

Book ID: 121307875
Publisher: IEEE
Year: 2008
Weight: 192 KB
Category: Article
ISBN: 1424423635
DOI: 10.1109/ESSDERC.2008.4681749

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