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[IEEE ESSDERC 2008 - 38th European Solid-State Device Research Conference - Edinburgh, UK (2008.09.15-2008.09.19)] ESSDERC 2008 - 38th European Solid-State Device Research Conference - Enhancing noise margins of FinFET SRAM by integrating Vth-controllable flexible-pass-gates

✍ Scribed by Endo, Kazuhiko; O'uchi, Shin-ichi; Ishikawa, Yuki; Liu, Yongxum; Matsukawa, Takashi; Masahara, Meishoku; Sakamoto, Kunihiro; Tsukada, Junichi; Ishii, Kenichi; Yamauchi, Hiromi; Suzuki, Eiichi

Book ID: 118215229
Publisher: IEEE
Year: 2008
Weight: 903 KB
Volume: 0
Category: Article
ISBN: 1424423635
DOI: 10.1109/essderc.2008.4681720

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