𝔖 Bobbio Scriptorium

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Reduction of electromigration—induced failure in aluminum metallization through anodization : A. J. Learn and W. H. Shepherd. Proc. IEEE Reliab. Phys. Symp. Las Vegas, U.S.A., 31 March–2 April (917)

Publisher: Elsevier Science
Year: 1971
Tongue: English
Weight: 108 KB
Volume: 10
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(71)90021-7

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