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Reducing edge effects and improving position resolution in position sensitive NaI(TI) detectors

โœ Scribed by Freifelder, R.; Haigh, A.T.; Karp, J.S.


Book ID
114554547
Publisher
IEEE
Year
1993
Tongue
English
Weight
611 KB
Volume
40
Category
Article
ISSN
0018-9499

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