Reduced leakage current of nickel induced crystallization poly-Si TFTs by a simple chemical oxide layer

✍ Scribed by Ming-Hui Lai; YewChung Sermon Wu

• Book ID: 113916052
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 606 KB
• Volume: 64
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2011.07.002