Reduced Impact of Induced Gate Noise on Inductively Degenerated LNAs in Deep Submicron CMOS Technologies

✍ Scribed by Paolo Rossi,Francesco Svelto…

• Book ID: 126369353
• Publisher: Springer
• Year: 2005
• Tongue: English
• Weight: 113 KB
• Volume: 42
• Category: Article
• ISSN: 0925-1030
• DOI: 10.1023/B:ALOG.0000042325.54391.e6