Reduced Impact of Induced Gate Noise on Inductively Degenerated LNAs in Deep Submicron CMOS Technologies

✍ Scribed by Paolo Rossi; Francesco Svelto; Andrea Mazzanti; Pietro Andreani

• Book ID: 106342187
• Publisher: Springer
• Year: 2004
• Tongue: English
• Weight: 145 KB
• Volume: 42
• Category: Article
• ISSN: 0925-1030
• DOI: 10.1007/s10470-004-6845-z