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Rectifier effect in the I-V characteristic of Ni-NiO-Ni thin films

✍ Scribed by M. Gvishi


Book ID
107862221
Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
199 KB
Volume
35
Category
Article
ISSN
0040-6090

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Effect of impurities on intrinsic stress
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Cr, Ti, Hf, Zr, Co, Ta, I'd, and Pt. The AI-Cr system was investigated in some detail using a conductance method and nuclear backscattering for reaction-rate measurements. The compounds CrAl, and Cr2AI,, were identified and their growth was found to be diffusion controlled. The temperature dependenc