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Reconstruction of the permittivity profile using a nonlinear guided wave technique

โœ Scribed by V. Mikhnev; E. Nyfors; P. Vainkainen

Book ID
126758029
Publisher
IEEE
Year
1997
Tongue
English
Weight
135 KB
Volume
45
Category
Article
ISSN
0018-926X

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## Abstract This paper describes a procedure for the characterization of defects inside dielectric materials. This nondestructive technique is supported by the development of a system that operates at 35 GHz. The reconstruction of the defect profile is performed by considering that the measured dat