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One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques

✍ Scribed by M. Maazi; D. Glay; T. Lasri

Book ID
102515279
Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
148 KB
Volume
43
Category
Article
ISSN
0895-2477

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✦ Synopsis

Abstract

This paper describes a procedure for the characterization of defects inside dielectric materials. This nondestructive technique is supported by the development of a system that operates at 35 GHz. The reconstruction of the defect profile is performed by considering that the measured data are the result of a convolution of the true data with a point‐spread function (PSF). Β© 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 133–138, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20399

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