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Reconstruction of dependences of the tunneling current on the oxide voltage using the dynamic current-voltage characteristics of then+-Si-SiO2-n-Si heterostructures

✍ Scribed by A. G. Zhdan; N. F. Kukharskaya; V. G. Naryshkina; G. V. Chucheva


Book ID
111443877
Publisher
Springer
Year
2007
Tongue
English
Weight
284 KB
Volume
41
Category
Article
ISSN
1063-7826

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