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Recombination in the space charge region and its effect on the transmittance of bipolar transistors

✍ Scribed by S. V. Bulyarskii; N. S. Grushko; A. I. Somov; A. V. Lakalin

Book ID
110119622
Publisher
Springer
Year
1997
Tongue
English
Weight
97 KB
Volume
31
Category
Article
ISSN
1063-7826

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## Abstract Diffusion length of minority carriers in CdTe wafers was measured by the surface photovoltage (SPV) method. A model including recombination in the space‐charge region (SCR) is presented to explain the SPV spectra. Assuming a thick neutral bulk and an electric field only in the SCR, five