Surface photovoltaic effect in CdTe as i
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Toušek, J. ;Toušková, J. ;Belas, E. ;Votoček, L.
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Article
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2007
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John Wiley and Sons
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English
⚖ 331 KB
## Abstract Diffusion length of minority carriers in CdTe wafers was measured by the surface photovoltage (SPV) method. A model including recombination in the space‐charge region (SCR) is presented to explain the SPV spectra. Assuming a thick neutral bulk and an electric field only in the SCR, five