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Recombination activity and electrical levels of “clean” and copper contaminated dislocations in p-type Si

✍ Scribed by O. F. Vyvenko; M. Kittler; W. Seifert; M. V. Trushin


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
89 KB
Volume
2
Category
Article
ISSN
1862-6351

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Recombination activity of “clean” and co
✍ M. Kittler; C. Ulhaq-Bouillet; V. Higgs 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 550 KB

The recombination at misfit dislocations in Si(Ge) structures was studied by the technique of electron-beam-induced current. The contrast temperature dependence was interpreted using the Schokley-Read-Hall recombination theory. Different situations were observed: either a dominance of shallow centre